Scanning Three-Dimensional X-ray Diffraction Microscopy with a Spiral Slit
نویسندگان
چکیده
Recently, nondestructive evaluation of the stresses localized in grains was achieved for plastically deformed low-carbon steel using scanning three-dimensional X-ray diffraction (S3DXRD) microscopy with a conical slit. However, applicable metals and alloys were restricted to single phase evaluated stress underestimated due fixed Bragg angles slit optimized αFe. We herein propose S3DXRD rotating spiral adaptable various accurate sweeping angles. Validation experiments 50-keV microbeam conducted as body-centered cubic (BCC) pure Cu face-centered (FCC) phase. As result orientation mapping, polygonal grain shapes clear boundaries observed both BCC FCC metals. Thus, it demonstrated that will be alloys, multiphase higher photon energy within an range determined by focusing optics. In principle, this implies becomes larger thicker metal alloy samples instead current miniature test or wire-shaped if higher-energy is available.
منابع مشابه
X-Ray Diffraction and Scanning Probe Microscopy
Diffraction can occur when electromagnetic radiation interacts with a periodic structure whose repeat distance is about the same as the wavelength of the radiation. Visible light, for example, can be diffracted by a grating that contains scribed lines spaced only a few thousand angstroms apart, about the wavelength of visible light. X-rays have wavelengths on the order of angstroms, in the rang...
متن کاملHigh-resolution ab initio three-dimensional x-ray diffraction microscopy.
Coherent x-ray diffraction microscopy is a method of imaging nonperiodic isolated objects at resolutions limited, in principle, by only the wavelength and largest scattering angles recorded. We demonstrate x-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the three-...
متن کاملNano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy
ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...
متن کاملNano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy
ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...
متن کاملThree-dimensional image reconstruction of radiation-sensitive samples with x-ray diffraction microscopy
Chien-Chun Chen,1,2 Chien-Hung Lu,1,4 D. Chien,3 Jianwei Miao,2 and T. K. Lee1,* 1Institute of Physics, Academia Sinica, Nankang, Taipei 11529, Taiwan 2Department of Physics and Astronomy and California NanoSystems Institute, University of California Los Angeles, Los Angeles, California 90095, USA 3Department of Mathematics, California State University San Marcos, San Marcos, California 92096, ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Quantum beam science
سال: 2023
ISSN: ['2412-382X']
DOI: https://doi.org/10.3390/qubs7020016